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    3. Portable device for field spectroscopy

    Portable device for field spectroscopy

    Wavelength range 350 nm – 2500 nm
    Resolution VNIR @ 700 nm 3 nm
    Resolution SWIR @ 1400 & 2100 nm 10 nm
    Spectral Sampling (Bandwidth) VNIR @ 700 nm 1.4 nm
    Spectral Sampling (Bandwidth) SWIR @ 1400 & 2100 nm 1.1 nm
    Scanning time 100 milliseconds
    NEdL (Noise Equivalent Radiance) - VNIR @ 700 nm 1.0 x 10-9 W/cm2/nm/sr
    NEdL - SWIR 1 @ 1400 nm 1.2 x 10-9
    W/cm2/nm/sr
    NEdL - SWIR 2 @ 2100 nm 1.9 x 10-9
    W/cm2/nm/sr
    Wavelength accuracy 0.5 nm average error of wavelength calibration fit.
    Wavelength accuracy +/- 1 nm for any one line
    Maximum radiance - VNIR 2x Solar
    Maximum radiance - SWIR 10x Solar
    Data collection speed 2 spectra per second
    Channels 2151
    VNIR (350-1000 nm) detector 512 element NIR-enhanced silicon array
    SWIR 1 (1000-1800 nm) detector Graded Index InGaAs Photodiode, 2 Stage TE Cooled
    SWIR 2 (1800-2500 nm) detector Graded Index InGaAs Photodiode, 2 Stage TE Cooled
    Input 1.5 m fiber optic (25° field of view); optional fore optics
    and optional longer fiber optic cables available
    Weight 5.44 kg (12 lbs.)
    Calibrations
    Wavelength, absolute reflectance, radiance*,
    irradiance*. All calibrations are NIST traceable.
    (*radiometric calibrations are optional)
    Instrument Controller Dell Latitude 5490 or other Windows 10 compatible laptop
    Warranty One-year full warranty including expert customer support
    Storage temperature (°C) -15 to 45
    Operational temperature range (°C) 0 to 40
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      CATALOG NUMBER: ASD-FS-Hi-Res
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      Wavelength range 350 nm – 2500 nm
      Resolution VNIR @ 700 nm 3 nm
      Resolution SWIR @ 1400 & 2100 nm 10 nm
      Spectral Sampling (Bandwidth) VNIR @ 700 nm 1.4 nm
      Spectral Sampling (Bandwidth) SWIR @ 1400 & 2100 nm 1.1 nm
      Scanning time 100 milliseconds
      NEdL (Noise Equivalent Radiance) - VNIR @ 700 nm 1.0 x 10-9 W/cm2/nm/sr
      NEdL - SWIR 1 @ 1400 nm 1.2 x 10-9
      W/cm2/nm/sr
      NEdL - SWIR 2 @ 2100 nm 1.9 x 10-9
      W/cm2/nm/sr
      Wavelength accuracy 0.5 nm average error of wavelength calibration fit.
      Wavelength accuracy +/- 1 nm for any one line
      Maximum radiance - VNIR 2x Solar
      Maximum radiance - SWIR 10x Solar
      Data collection speed 2 spectra per second
      Channels 2151
      VNIR (350-1000 nm) detector 512 element NIR-enhanced silicon array
      SWIR 1 (1000-1800 nm) detector Graded Index InGaAs Photodiode, 2 Stage TE Cooled
      SWIR 2 (1800-2500 nm) detector Graded Index InGaAs Photodiode, 2 Stage TE Cooled
      Input 1.5 m fiber optic (25° field of view); optional fore optics
      and optional longer fiber optic cables available
      Weight 5.44 kg (12 lbs.)
      Calibrations
      Wavelength, absolute reflectance, radiance*,
      irradiance*. All calibrations are NIST traceable.
      (*radiometric calibrations are optional)
      Instrument Controller Dell Latitude 5490 or other Windows 10 compatible laptop
      Warranty One-year full warranty including expert customer support
      Storage temperature (°C) -15 to 45
      Operational temperature range (°C) 0 to 40

      TECHNICAL DATA

        FUNCTIONS

        DESCRIPTION

        Wavelength range 350 nm – 2500 nm
        Resolution VNIR @ 700 nm 3 nm
        Resolution SWIR @ 1400 & 2100 nm 10 nm
        Spectral Sampling (Bandwidth) VNIR @ 700 nm 1.4 nm
        Spectral Sampling (Bandwidth) SWIR @ 1400 & 2100 nm 1.1 nm
        Scanning time 100 milliseconds
        NEdL (Noise Equivalent Radiance) - VNIR @ 700 nm 1.0 x 10-9 W/cm2/nm/sr
        NEdL - SWIR 1 @ 1400 nm 1.2 x 10-9
        W/cm2/nm/sr
        NEdL - SWIR 2 @ 2100 nm 1.9 x 10-9
        W/cm2/nm/sr
        Wavelength accuracy 0.5 nm average error of wavelength calibration fit.
        Wavelength accuracy +/- 1 nm for any one line
        Maximum radiance - VNIR 2x Solar
        Maximum radiance - SWIR 10x Solar
        Data collection speed 2 spectra per second
        Channels 2151
        VNIR (350-1000 nm) detector 512 element NIR-enhanced silicon array
        SWIR 1 (1000-1800 nm) detector Graded Index InGaAs Photodiode, 2 Stage TE Cooled
        SWIR 2 (1800-2500 nm) detector Graded Index InGaAs Photodiode, 2 Stage TE Cooled
        Input 1.5 m fiber optic (25° field of view); optional fore optics
        and optional longer fiber optic cables available
        Weight 5.44 kg (12 lbs.)
        Calibrations
        Wavelength, absolute reflectance, radiance*,
        irradiance*. All calibrations are NIST traceable.
        (*radiometric calibrations are optional)
        Instrument Controller Dell Latitude 5490 or other Windows 10 compatible laptop
        Warranty One-year full warranty including expert customer support
        Storage temperature (°C) -15 to 45
        Operational temperature range (°C) 0 to 40

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